Specifications
Operating Tibbit #61-1 in extreme conditions (e.g., close to the "Absolute Maximum Ratings" listed below) for extended periods can lead to component aging, performance degradation, and premature failure.
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Absolute Maximum Ratings |
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Supply Voltage |
0V to +5.5V |
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VIN1+, VIN1-, VIN2+, VIN2- Voltage Relative to Isolated GND |
–50V to +50V |
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IIN1, IIN2 Voltage Relative to Isolated GND |
-0.3V to +20V |
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Current Inflow into IIN1, IIN2 |
0mA to +50mA |
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Operating Temperature |
–40°C to +85°C |
This Tibbit is tested according to procedures I, II, and III of MIL-STD-810H Method 501.7 and MIL-STD-810H Method 502.7.
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Nominal Electrical Characteristics |
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Input Supply Voltage |
4.5VDC to 5.5VDC |
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Current Consumption (no load on 24V output) |
120mA |
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Current Consumption (75mA load on 24V output) |
500mA |
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VIN1+, VIN1-, VIN2+, VIN2- Voltage Relative to Isolated GND (Single-ended) |
0V to +10V |
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Differential Voltage Input |
–10V to +10V |
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Current Inflow into IIN1, IIN2 |
0mA to +20mA |
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Input Resistance for Voltage Inputs (Single-ended) |
>1MΩ |
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Input Resistance for Voltage Inputs (Differential) |
>2MΩ |
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Input Resistance for Current Inputs |
~240Ω |
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24VDC Output Voltage |
21VDC~26VDC |
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24VDC Output Current Capability |
75mA |
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Digital Lines, LOW State |
0V to 0.8V |
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Digital Lines, HIGH State |
2V to 3.3V |
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Functional Characteristics (Verified @ 25°C) |
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Sampling Mode for Voltage Inputs |
Single-ended or Differential |
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Sampling Mode for Current Inputs |
Single-ended |
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Single-ended Input Voltage Range |
0V to +10V |
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Differential Input Voltage Range |
–10V to +10V |
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Common-mode Input Voltage (Differential Mode) |
–20V to +20V |
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Sampling Frequency |
1.25SPS to 31.25kSPS** |
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Nominal Output Resolution |
24-bit |
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Effective Peak-to-peak Output Resolution for Voltage Inputs at 1.25sample/second |
19-bit* |
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Effective Peak-to-peak Output Resolution for Current Inputs at 1.25sample/second |
20-bit* |
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Average Offset @ Full-scale and Effective Output Resolution for Voltage Inputs |
< ±15mV* |
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Average Offset @ Full-scale and Effective Output Resolution for Current Inputs |
< ±15uA* |
* Tibbit #61-1 is calibrated for linearity and resolution during the quality control stage of production. However, the higher the sampling frequency, the lower the resolution.
** The ADC chip is capable of this range but going to high sampling rates might not be achievable on TiOS-based platforms (TPP2 or TPP3). LTPP3G2, which is Linux-based and has a high-performance CPU, can get to higher data rates more naively.
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Temperature Effect (Compared with Characteristics @ 25°C) |
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Maximum Added Error @ -40°C for Voltage Inputs at Full-scale |
< ±5mV |
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Maximum Added Error @ +85°C for Voltage Inputs at Full-scale |
< ±5mV |
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Maximum Added Error @ -40°C for Current Inputs at Full-scale |
< ±20uA |
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Maximum Added Error @ +85°C for Current Inputs at Full-scale |
< ±40uA |
If you want to achieve a higher reading accuracy across wide temperature ranges, you may utilize the embedded temperature sensor. You can use the temperature value to apply compensations/corrections to the read ADC values based on the temperature of the ADC chip.
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Interface Characteristics |
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Interface Type (ADC chip) |
SPI (Mode 3) |
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SCLK (SPI) Frequency (Recommended) |
400kHz |
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Interface Type (EEPROM) |
I2C |
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SCL (I2C) Frequency |
100kHz |